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A framework for generation of monitor and plant model from event logs using process mining for formal verification of event-driven systems
| Theme: | ||
| Author: | ||
| Type: | Article | |
| Kind: | Electronic copy | |
| Parts: | 1 | |
| The year of publishing: | 2024 | |
| Publishing house: | IEEE Publisher | |
| Publishing place: | USA | |
| The target audience: | Researcher | |
| Special purpose: | Scientific | |
| Copyright holder: | IEEE | |
| DOI: | 10.1109/OJIES.2024.3406059 | |
| SJR: | 6.138 | |
| Bibliographic reference: | Xavier M., Dubinin V., Patil S., Vyatkin V. A framework for generation of monitor and plant model from event logs using process mining for formal verification of event-driven systems // IEEE Open Journal of the Industrial Electronics Society. – 2024. – Volume 5. – P. 517-534. | |
| Url: | https://ieeexplore.ieee.org/document/10550182 | |
| Language: | English | |
| Post date: | 02.11.2024 |