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Estimates of Reliability Indicators for Failure-Free Tests Conducted According to the Binomial Plan
| Theme: | ||
| Author: | Юрков Николай Кондратьевич | |
| Type: | Article | |
| Kind: | Electronic copy | |
| Parts: | 1 | |
| The year of publishing: | 2020 | |
| Publishing house: | Institute of Electrical and Electronics Engineers Inc | |
| Publishing place: | Moscow Workshop on Electronic and Networking Technologies, MWENT 2020 - Proceedings | |
| The target audience: | Teacher | |
| Special purpose: | Scientific | |
| Copyright holder: | N. K. Yurkov, V. S. Mikhaylov | |
| ISBN: | 978-172812571-8 | |
| DOI: | 10.1109/MWENT47943.2020.9067421 | |
| Bibliographic reference: | N. K. Yurkov and V. S. Mikhaylov, "Estimates of Reliability Indicators for Failure-Free Tests Conducted According to the Binomial Plan," 2020 Moscow Workshop on Electronic and Networking Technologies (MWENT), Moscow, Russia, 2020, pp. 1-6. doi: 10.1109/MWENT47943.2020.9067421 | |
| Pages: | 1-6 | |
| Url: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85083972330&origin=inward | |
| Language: | English | |
| Post date: | 20.11.2020 |